پایان نامه کارشناسی ارشد الکترونیک

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قیمت پایان نامه کارشناسی ارشد الکترونیک مربوط به مبدل های آنالوگ به دیجیتال: 5,000 تومان 

پایان نامه کارشناسی ارشد الکترونیک، مبدل های آنالوگ به دیجیتال

مبدل های آنالوگ به دیجیتال سریع با ولتاژ تغذیه و توان پایین امروزه از عناصر کلیدی سیستمهای پردازشی و مخابراتی به شمار می روند. کاربرد روز افزون دستگاههای الکترونیکی که با باتری کار می کنند، مسئله ولتاژ تغذیه و بخصوص توان مصرفی را از اهمیت ویژه ای برخوردار ساخته است.

این پایان نامه به زبان انگلیسی مربوط به  سال 2011 دانشگاه لینشوپینگ سوئد می باشد.

Abstract
The scaling of CMOS technologies has increased the performance of general purpose processors and DSPs. However, analog circuits designed in the same process have not been able to utilize the scaling to the same extent, suffering from reduced voltage headroom and reduced analog gain. Integration of the system components on the same die means that the analog-to-digital converters (ADCs) needs to be implemented in the newest technologies in order to utilize the digital capabilities at these process nodes. To design efficient ADCs in nanoscale CMOS technologies, there is a need to both understand the physical limitations as well as to develop new architectures and circuits that take full advantage of the potential that process has to offer
As the technology scales to smaller feature sizes, the possible sample-rate of ADCs can be increased. This thesis explores the design of high-speed ADCs and investigates architectural and circuit concepts that address the problems associated with lower supply voltage and analog gain. The power dissipation of Nyquist rate ADCs is investigated and lower bounds, as set by both thermal noise and minimum feature sizes are formulated. Utilizing the increasing digital performance, low-accuracy analog components can be used, assisted by digital correction or calibration, which leads to a reduction in power dissipation. Through the aid of new techniques and concepts, the power dissipation of low-to-medium resolution ADCs benefit from going to more modern CMOS processes, which is supported by both theory and published results